Under one aspect, a method for characterizing current of an operating device under test (DUT) includes injecting a signal into a superconducting sensor; determining a property of the superconducting sensor based on the injected signal; disposing the superconducting sensor in spaced relationship to the operating DUT; inducing a magnetic field in the superconducting sensor based on the spaced relationship, the current of the operating DUT, and the injected signal; determining a change in the property of the superconducting sensor resulting from the induced magnetic field; and estimating current of the operating DUT based on the change in the property of the superconducting sensor.
Systems and methods for detecting current using a kinetic inductance magnetic current imager
Systems and methods for detecting current using a kinetic inductance magnetic current imager
Issue
Date
Publication Date
Patent No.
10,310,027
Category
Device or Machine
Keywords: current, inductance, kinetic
International Class: H01F 6/04 (20060101), G01R 33/035 (20060101), G01R 15/20 (20060101), G01R 31/26 (20140101)